Attendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users. The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT's, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.
Rates: *Rates include lunches on all days*
Georgia Tech Rate: $150
Academic and Government Rate: $250
Industry Rate: $500
Agenda
Day1 – Photoelectron Spectroscopy:
08:30 – Registration starts
09:00: Introduction and Scope of Short Course – Prof. F. Alamgir
Morning session including the following activities:
- Lecture onTheoretical background of Photoelectron Spectroscopy
- Tour of MCF characterization labs
- Coffee break
12:00 – 13:00: Lunch break
Afternoon session include the following activities:
- Introduction to XPS analysis software
- XPS hands-on operation and data analysis sessions.
15:10 – 16:00: General comments: Open question and answer session
Day2 – Time of Flight SIMS:
09:00 – Breakfast starts
09:30: Introduction– Prof. F. Alamgir
Morning session including the following activities:
- Tour of IEN microfabrication facility
- Coffee break
- Practical concerns for ToF-SIMS and Alternate Surface Science Techniques
11:30 – 13:00: Lunch break
Afternoon session including the following activities:
- Remote Demonstration of ToF-SIMS operation
- ToF-SIMS Data analysis and/or hands-on session.
- Open question and answer session
16:00: Closing comments